Investigation of Electron Contamination on Flattened and Unflattened Varian Clinac iX 6X and 15X Photon Beam Based on Monte Carlo Simulation
نویسندگان
چکیده
The aim of this study was to characterize electron contamination a flattened (FF) and an unflattened (FFF) Varian Clinac iX 6X 15X photon beams using Monte Carlo (MC) simulation. EGSnrc MC technique used model the head simulate dose distribution FF FFF beam in water phantom. materials geometrical data linac were provided by Tan Tock Seng Hospital (TTSH) Singapore. modeled removing flattening filter component linac. Phase space files scored after phantom surface. phsp analyzed particles produced BEAMDP. contaminants contribute around 1 % 2 phsp1 for beams, respectively. photons are scattered small-angle range 0 – 4 o . contaminant contributes up one hundredth compared photons. increase field area affects penumbra width due increasing number particle out area. surface dose. smaller than same size energy.
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ژورنال
عنوان ژورنال: Atom Indonesia
سال: 2022
ISSN: ['0126-1568', '2356-5322']
DOI: https://doi.org/10.17146/aij.2022.1180